JPS6075907A - サ−ボ回路のル−プゲイン測定方法 - Google Patents

サ−ボ回路のル−プゲイン測定方法

Info

Publication number
JPS6075907A
JPS6075907A JP58183527A JP18352783A JPS6075907A JP S6075907 A JPS6075907 A JP S6075907A JP 58183527 A JP58183527 A JP 58183527A JP 18352783 A JP18352783 A JP 18352783A JP S6075907 A JPS6075907 A JP S6075907A
Authority
JP
Japan
Prior art keywords
resistor
amplifier circuit
circuit
servo circuit
loop gain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58183527A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0452482B2 (en]
Inventor
Hideyuki Baba
馬場　秀幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP58183527A priority Critical patent/JPS6075907A/ja
Publication of JPS6075907A publication Critical patent/JPS6075907A/ja
Publication of JPH0452482B2 publication Critical patent/JPH0452482B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/20—Automatic control
    • H03G3/30—Automatic control in amplifiers having semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP58183527A 1983-09-30 1983-09-30 サ−ボ回路のル−プゲイン測定方法 Granted JPS6075907A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58183527A JPS6075907A (ja) 1983-09-30 1983-09-30 サ−ボ回路のル−プゲイン測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58183527A JPS6075907A (ja) 1983-09-30 1983-09-30 サ−ボ回路のル−プゲイン測定方法

Publications (2)

Publication Number Publication Date
JPS6075907A true JPS6075907A (ja) 1985-04-30
JPH0452482B2 JPH0452482B2 (en]) 1992-08-24

Family

ID=16137393

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58183527A Granted JPS6075907A (ja) 1983-09-30 1983-09-30 サ−ボ回路のル−プゲイン測定方法

Country Status (1)

Country Link
JP (1) JPS6075907A (en])

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62264442A (ja) * 1986-05-12 1987-11-17 Olympus Optical Co Ltd ル−プゲイン測定装置
JPH04133114U (ja) * 1992-04-27 1992-12-10 ヤンマー農機株式会社 田植機
US5408387A (en) * 1991-11-30 1995-04-18 Meitaku System Co., Ltd. Edge light panel and its production
US5775791A (en) * 1992-08-31 1998-07-07 Copal Company Limited Surface emission apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62264442A (ja) * 1986-05-12 1987-11-17 Olympus Optical Co Ltd ル−プゲイン測定装置
US5408387A (en) * 1991-11-30 1995-04-18 Meitaku System Co., Ltd. Edge light panel and its production
JPH04133114U (ja) * 1992-04-27 1992-12-10 ヤンマー農機株式会社 田植機
US5775791A (en) * 1992-08-31 1998-07-07 Copal Company Limited Surface emission apparatus

Also Published As

Publication number Publication date
JPH0452482B2 (en]) 1992-08-24

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